Device for measuring a variation in the capacitance of a variable capacitive structure
US8629685B2 · kind B2 · utility
1Cited by
6References
15Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Oct 29, 2009 |
| Grant date | Jan 14, 2014 |
| Priority date | — |
| Expiry date | Jan 12, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K2217/960725
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device for measuring a variation in the capacitance of a variable capacitive structure, includes:
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.