Patent · US Active

In-situ contact potential measurement in hard-disk drives

US8630057B2 · kind B2 · utility

10Cited by

4References

20Claims

0Family size

Assignee

HGST Netherlands, B.V. · NL

Inventors

Aravind N. Murthy · San Jose, US
Remmelt Pit · Menlo Park, US
Karl A. Flechsig · Los Gatos, US

Key dates

Filing date	Jun 13, 2012
Grant date	Jan 14, 2014
Priority date	—
Expiry date	Jul 18, 2032

Classification

Technology area (CPC G)Physics
CPC primaryG11B5/6076
WIPO fieldAudio-visual technology
WIPO sectorElectrical engineering

Abstract

Approaches are provided for a hard-disk drive (HDD) and a method for measuring the contact potential between head and disk interfaces within a hard-disk drive. In one example, a voltage bias is applied to a head slider at discrete increments, and the touchdown power is determined at each increment. The voltage bias at which the TDP maximizes equals the inverse polarity of the inherent contact potential between the head slider and disk, and this value may be used to apply a voltage that neutralizes the contact potential.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.