Method to determine a background phase in phase image data sets

US8630471B2 · kind B2 · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Rares Salomir · Bonneville, FR
• Magalie Viallon · Val-de-Reuil, FR
• Joerg Roland · Hemhofen, DE
• Patrick Gross · Langensendelbach, DE

Key dates

• Filing date: Dec 16, 2010
• Grant date: Jan 14, 2014
• Expiry date: Mar 7, 2032

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R33/56509
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

In a method to determine a background phase in phase values of a phase image data set that is acquired from an examination subject, wherein the background phase is determined in a partial region of the phase image data set, the phase image data set of the examination subject is acquired, and a substantially closed, planar contour is established in the phase image data set around the partial region, the planar contour having a contour area with a width of at least one pixel of the phase image data set. The phase values in the partial region are determined with the assumption that the spatial curve of the background phase is a harmonic or quasi-harmonic function, the phase values of the pixels in the partial region being determined based on the phase values in the planar contour.