Circuit instance variation probability system and method
US8631362B1 · kind B1 · utility
5Cited by
2References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 25, 2013 |
| Grant date | Jan 14, 2014 |
| Priority date | — |
| Expiry date | Feb 25, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2111/08
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and process for utilizing probability distribution information about process parameters to quantify the probability of manufacturing process variation for variants of circuit designs in order to more efficiently analyze and simulate the designs.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.