SS OCT interferometry for measuring a sample
US8632181B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 12, 2009 |
| Grant date | Jan 21, 2014 |
| Priority date | — |
| Expiry date | May 27, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2290/70
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An SS OCT interferometry device for measuring a sample, in particular from an eye. The device interferometrically generates a measuring signal and from the signal a depth-resolved contrast signal of the sample by spectral tuning of the central wavelength of the measurement radiation of a measuring signal, and has a control unit for this purpose. The device includes a sample motion detector, which provides a motion signal indicating movement of or in the sample, the control unit uses the motion signal to correct the measuring signal with respect to measuring errors that are caused by a movement of or in the sample before or during the generation of the depth-resolved contrast signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.