Monitoring of optical defects in an image capture system
US8634004B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 11, 2010 |
| Grant date | Jan 21, 2014 |
| Priority date | — |
| Expiry date | Aug 14, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N17/002
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Method of monitoring an image capture system (1) comprising a sensor (C) comprising a plurality of photosensitive elements (Z1, Z2, Zn) and an optical device (L) for focusing the light emitted from a scene towards the sensor. This method comprises the obtaining (100) of respective responses of certain at least of the photosensitive elements (E1, E1′, P1, P2) of the sensor to an exposure of the image capture system to any scene (S), followed by a determination (200) of at least one deviation (Δ) between at least one quantity (G) deduced from the responses obtained and at least one reference quantity (Gref). These steps may be followed by an estimation (300) of an optical effect of the image capture system (1) on the basis of said deviation (Δ) determined and optionally by an implementation of an action able to at least partially compensate (400) for the estimated optical defect.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.