Imaging device analysis systems and imaging device analysis methods
US8634014B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 8, 2005 |
| Grant date | Jan 21, 2014 |
| Priority date | — |
| Expiry date | Apr 11, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N17/002
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Imaging device analysis systems and imaging device analysis methods are described. According to one embodiment, an imaging device analysis system includes a light source configured to output light for use in analyzing at least one imaging component of an imaging device, wherein the imaging device is configured to generate images responsive to received light, and processing circuitry coupled with the light source and configured to control the light source to optically communicate the light to the imaging device, wherein the processing circuitry is further configured to access image data generated by the imaging device responsive to the reception, by the imaging device, of the light from the light source and to process the image data to analyze an operational status of the at least one imaging component.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.