Multifunctional nanoscopy for imaging cells
US8637944B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 6, 2013 |
| Grant date | Jan 28, 2014 |
| Priority date | — |
| Expiry date | May 6, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C13/0019
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed herein is an apparatus comprising a metal shunt and a planar semiconductor material in electrical contact with the metal shunt, the metal shunt located on a surface of the semiconductor material, thereby defining a semiconductor/metal interface for passing a flow of current between the semiconductor material and the metal shunt in response to an application of an electrical bias to the apparatus, wherein a portion of that semiconductor material surface is not covered by the metal shunt, wherein the semiconductor material and the metal shunt lie in different planes that are substantially parallel planes, the semiconductor/metal interface thereby being parallel to the plane of semiconductor material, and wherein, when under the electrical bias, the semiconductor/metal interface is configured to exhibit a change in resistance thereof in response to a perturbation. Such an apparatus can be used as a sensor and deployed as an array of sensors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.