Measuring head for a chassis measuring system, chassis measuring system and method for determining the position parameters of measuring heads of a chassis measuring system
US8638452B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 2, 2009 |
| Grant date | Jan 28, 2014 |
| Priority date | — |
| Expiry date | Nov 7, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2210/286
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A chassis measuring system comprises an illumination device for producing a structured illumination (38, 58, 78, 98), which is developed in such a way that it produces a structured image on a measuring head (32, 52; 72, 92) situated opposite in the transverse vehicle direction, a reference surface (40, 60, 80, 100) facing in the same direction as the illumination device (38, 58, 78, 98), on which a structured image produced by an illumination device (38, 58; 78, 98) of the measuring head (32, 52; 72, 92) situated opposite in the transverse vehicle direction may be projected, and at least one measuring camera (34, 36; 54, 56; 74, 76; 94, 96) facing in the same direction as the illumination device (38, 58, 78, 98), which is developed in such a way that it detects the structured image on the reference surface (40, 60; 80, 100) of the opposite measuring head (32, 52; 72, 92) in order to determine the position parameters of the measuring head (32, 52, 72, 92).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.