Patent · US Active

Measurement and testing system

US8643669B1 · kind B1 · utility

91Cited by
11References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 22, 2012
Grant dateFeb 4, 2014
Priority date
Expiry dateDec 27, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F3/0482
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A measurement and testing system includes a measurement assembly having at least one measurement device, at least one visual display device, and a data acquisition and processing device operatively coupled to the at least one measurement device of the measurement assembly and the visual display device. In one embodiment, the data acquisition and processing device is further configured to generate a timeline bar with date icons on the output screen of the visual display device. In other embodiments, the data acquisition and processing device is further configured to automatically displace a side bar menu on the output screen when a user switches from a current mode to another mode, read external files containing one or more testing routines written off-site, and/or automatically alert a system user when one or more signals from a measurement device are no longer detected and/or are corrupted.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.