Calibrating multi-dimensional sensor for offset, sensitivity, and non-orthogonality
US8645093B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 4, 2009 |
| Grant date | Feb 4, 2014 |
| Priority date | — |
| Expiry date | Sep 9, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F3/038
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A multi-dimensional sensor, a magnetometer or accelerometer, is calibrated based on the raw data provided by the sensor. Raw data is collected and may be used to generate ellipse or ellipsoid parameters, for a two-dimensional or three-dimensional sensor, respectively. An offset calibration factor is calculated based on the raw data, e.g., the determined ellipse or ellipsoid parameters. A sensitivity calibration factor is then calculated based on the offset calibration factor and the raw data. A non-orthogonality calibration factor can then be calculated based on the calculated offset and sensitivity calibration factors. Using the offset, sensitivity and non-orthogonality calibration factors, the raw data can be corrected to produce calibrated data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.