Calibrating field uniformity
US8649076B2 · kind B2 · utility
2Cited by
4References
19Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jul 30, 2009 |
| Grant date | Feb 11, 2014 |
| Priority date | — |
| Expiry date | Jul 14, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N2201/0006
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods systems and methods for calibrating field uniformity are disclosed. An exemplary method includes scanning the imaging area including a first media to obtain optical data for a specular reflectance map. The method also includes scanning the imaging area including a second media to obtain optical data for a diffuse reflective map. The method also includes storing the specular reflectance map and the diffuse reflective map for adjusting actual pixel values during an imaging operation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.