Method and apparatus for determining a value of a zero point offset of a yaw rate sensor
US8649936B2 · kind B2 · utility
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11References
20Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 31, 2008 |
| Grant date | Feb 11, 2014 |
| Priority date | — |
| Expiry date | Jul 26, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01C25/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
There is described a method for determining a value of a zero point offset of a yaw rate sensor. The method comprises measuring over time the output of the yaw rate sensor, determining whether the measured output has remained within a set of limits for a pre-determined period and if it is determined that the measured output has remained within the limits for the pre-determined period, using at least one measured value of the output to determine the value of the zero point offset.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.