Active metric learning device, active metric learning method, and active metric learning program
US8650138B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 24, 2009 |
| Grant date | Feb 11, 2014 |
| Priority date | — |
| Expiry date | Aug 23, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An active metric learning device includes a metric application data analysis unit, a metric optimization unit, and an attribute clustering unit. The metric application data analysis unit is formed with a metric applying module for calculating the distance between data to be analyzed, a data analyzing module for analyzing the data using a predetermined function and the distances between the data to be analyzed and outputting the result of the data analysis, and an analysis result storage unit for storing the result of the data analysis. The metric optimization unit is formed with a feedback converting module for creating side information according to the command of feedback from the user and a metric learning module for generating a metric matrix optimized under a predetermined condition using the created side information. The attribute clustering unit clusters the metric matrix optimized by the metric optimization unit and structuralizes the attributes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.