Fail safe self test for motion sensor modules
US8650930B2 · kind B2 · utility
0Cited by
6References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 7, 2009 |
| Grant date | Feb 18, 2014 |
| Priority date | — |
| Expiry date | Sep 8, 2029 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB60W30/00
- WIPO fieldTransport
- WIPO sectorMechanical engineering
Abstract
A short duration test activation signal is applied to the test activation port of a motion sensor module and the test activation status port observed with an error flag being set if a corresponding signal does not appear at the test activation status port within a predetermined time period.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.