System and method for analysis of test pattern image data in an inkjet printer using a template
US8651615B2 · kind B2 · utility
3Cited by
16References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 19, 2011 |
| Grant date | Feb 18, 2014 |
| Priority date | — |
| Expiry date | Jul 29, 2032 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB41J2/2146
- WIPO fieldTextile and paper machines
- WIPO sectorMechanical engineering
Abstract
Test pattern template data are stored in a memory of a printer to identify locations spatially within image data of a test pattern printed by printheads in an inkjet printer. The test pattern template data identifies an origin of a test pattern in the image data and the distances between structures in the test pattern to enable test pattern structure in the image data to be detected and identified more easily.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.