Active matrix substrate, display device, method for inspecting active matrix substrate, and method for inspecting display device
US8653827B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 13, 2009 |
| Grant date | Feb 18, 2014 |
| Priority date | — |
| Expiry date | Jan 19, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02F1/136254
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
Provided is an active matrix substrate having improved display quality without forming an inspection line in a terminal arrangement region for inspecting short circuit between connection lines. Scanning lines (40) include first scanning lines having input ends for a scanning signal on one end side, and second scanning lines having input ends for a scanning signal the other end side. In a display region (4), the first scanning lines and the second scanning lines are formed alternately one by one. An active matrix substrate (2) includes a first inspection line (70) and a second inspection line (72) that cross each of a plurality of first connection lines (61), and a third inspection line (75) and a fourth inspection line (77) that cross each of a plurality of second connection lines (64). The first to the fourth inspection lines (70, 72, 75, 77) are formed in a frame-shaped wiring region (6), excluding the terminal arrangement region (5) and the display region (4).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.