Particle size analyzer
US8654330B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jun 24, 2010 |
| Grant date | Feb 18, 2014 |
| Priority date | — |
| Expiry date | Jun 24, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/8422
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention is a device for measuring the intensity of the light scattered by a thin film of a colloidal medium, comprising a monochromatic light source, a convergent optical system focusing the source onto the thin film to be analyzed comprising a dioptric element with one of the faces thereof constituting a first wall defining the thin film, at least one photosensitive detector producing a signal representing light scattered or backscattered by the thin film and means for processing the signal. A second wall of the device has a plane surface at the end of a rod.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.