Patent · US Active

Particle size analyzer

US8654330B2 · kind B2 · utility

0Cited by
4References
7Claims
0Family size

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Key dates

Filing dateJun 24, 2010
Grant dateFeb 18, 2014
Priority date
Expiry dateJun 24, 2030

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/8422
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present invention is a device for measuring the intensity of the light scattered by a thin film of a colloidal medium, comprising a monochromatic light source, a convergent optical system focusing the source onto the thin film to be analyzed comprising a dioptric element with one of the faces thereof constituting a first wall defining the thin film, at least one photosensitive detector producing a signal representing light scattered or backscattered by the thin film and means for processing the signal. A second wall of the device has a plane surface at the end of a rod.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.