Patent · US Active

Micromechanical tunable Fabry-Perot interferometer arrangement and a method for producing the same

US8654347B2 · kind B2 · utility

4Cited by
2References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 6, 2013
Grant dateFeb 18, 2014
Priority date
Expiry dateJun 6, 2033

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49117
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention relates to controllable Fabry-Perot interferometers which are produced with micromechanical (MEMS) technology. The prior art interferometers have a temperature drift which causes inaccuracy and requirement for complicated packaging. According to the invention the interferometer arrangement has both an electrically tuneable interferometer and a reference interferometer on the same substrate. The temperature drift is measured with the reference interferometer and this information is used for compensating the measurement with the tuneable interferometer. The measurement accuracy and stability can thus be improved and requirements for packaging are lighter.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.