Mixed signal integrated circuit, with built in self test and method
US8659309B2 · kind B2 · utility
Inventors
Key dates
| Filing date | Nov 3, 2010 |
| Grant date | Feb 25, 2014 |
| Priority date | — |
| Expiry date | Jun 21, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3187
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A mixed signal integrated circuit includes a signal source to inject a test signal into the signal path of the mixed signal integrated circuit, a feedback loop and a signal comparator for determining characteristics of a resulting signal. Conveniently, the test signal may be a digital signal injected upstream of a digital to analog converter (DAC). By connecting the output to the input, the entirety of the signal path and the majority of the integrated circuit may be tested. The signal may be condition or manipulated in the feedback loop. By incorporating test signal generation and measurement into the mixed signal integrated circuit, the cost of test equipment and the test duration for each device under test may be reduced.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.