Test apparatus for peripheral component interconnect expansion slot
US8659314B2 · kind B2 · utility
1Cited by
2References
7Claims
0Family size
Assignees
Inventors
Key dates
| Filing date | Apr 22, 2011 |
| Grant date | Feb 25, 2014 |
| Priority date | — |
| Expiry date | Feb 9, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2221
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A test apparatus includes a circuit board. The circuit board includes a number of first golden fingers arranged on a first side of the circuit board, and a first test circuit. The first test circuit includes a first capacitor. A first terminal of the first capacitor is grounded. A second terminal of the first capacitor is electrically connected to a first pin of the first golden fingers. A first test pad is connected to the second terminal of the first capacitor. A second test pad is connected to a second pin of the first golden fingers. The second pin is grounded.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.