Patent · US Active

Method for printed circuit board trace characterization

US8659315B2 · kind B2 · utility

2Cited by
5References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 4, 2012
Grant dateFeb 25, 2014
Priority date—
Expiry dateSep 14, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2818
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method is provided which measures PCB trace characteristics from measurements of a PCB trace structure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.