Smart probe
US8661700B2 · kind B2 · utility
29Cited by
11References
5Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 10, 2013 |
| Grant date | Mar 4, 2014 |
| Priority date | — |
| Expiry date | Jan 10, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B5/012
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present system, method, article of manufacture, software, and apparatus is an “intelligent” probe system and components thereof and may openly encompass, in at least an embodiment, an embedded IC chip located in an interchangeable probe(s) which offers repeatable, fast, easy, and error free probe swapping on a CMM.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.