Method and system for obtaining a first signal for analysis to characterize at least one periodic component thereof
US8666116B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 29, 2010 |
| Grant date | Mar 4, 2014 |
| Priority date | — |
| Expiry date | Oct 19, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30076
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of facilitating obtaining a first signal, for analysis to characterize at least one periodic component, includes obtaining two second signals representative of intensities of electromagnetic radiation. The first signal is at least derivable from an output signal obtainable by applying a transformation to the second signals such that any value of the output signal is based on values from each respective second signal at corresponding points in time. The method further includes obtaining a value of a variable determining influences of components of respective second signals on the output signal when the signals corresponding to the second signals are captured and the transformation is applied, by (i) analyzing the first, second and/or the output signals to select a value of a parameter corresponding to a respective one of the variables; or (ii) calculating values of at least one time-varying factor corresponding to a respective one of the variables.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.