Radiation analysis system and method
US8666711B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 12, 2012 |
| Grant date | Mar 4, 2014 |
| Priority date | — |
| Expiry date | Nov 12, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T7/005
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
A radiation analysis system/method that automatically optimizes the efficiency calibration of a counting system based on benchmark data and variable parameters associated with radiation source/sensor/environment (RSSE) combinations is disclosed. The system/method bifurcates RSSE context (SSEC) model parameters into WELL-KNOWN (fixed) parameters (WNP) and NOT-WELL-KNOWN (variable) parameters (NWP). The NWP have associated lower/upper limit values (LULV) and a shape distribution (LUSD) describing NWP characteristics. SSEC models are evaluated using randomized statistical NWP variations or by using smart routines that perform a focused search within the LULV/LUSD to generate model calibration values (MCV) and calibration uncertainty values (UCV) describing the overall SSEC efficiencies. Sensor measurements using the MCV/UCV generate a measurement value and uncertainty estimation value. An exemplary embodiment optimizes geometry models of radiation sources by benchmarking with respect to measurement data from spectroscopy detectors and/or dose rate detectors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.