Patent · US Active

Extensible testing system

US8667333B2 · kind B2 · utility

2Cited by
8References
15Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 31, 2011
Grant dateMar 4, 2014
Priority date—
Expiry dateMay 7, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2849
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A computer implemented system for testing electronic equipment where a plurality of types of systems can be tested using a single test specification.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.