Circuit simulation methodology to calculate leakage current during any mode of circuit operation
US8667442B1 · kind B1 · utility
4Cited by
1References
35Claims
0Family size
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Key dates
| Filing date | Jun 14, 2012 |
| Grant date | Mar 4, 2014 |
| Priority date | — |
| Expiry date | Jun 14, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2119/06
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for calculating leakage current associated with an integrated circuit, includes selecting a sampling point at which an input signal for the integrated circuit is in a quiescent state and determining the leakage current associated with the integrated circuit using the selected sampling point.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.