Arrangement of analyzer measuring window
US8670524B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 24, 2010 |
| Grant date | Mar 11, 2014 |
| Priority date | — |
| Expiry date | Mar 13, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/635
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to an arrangement of a measuring window in a continuously operated X-ray analyzer (1), said analyzer being is used particularly for analyzing elemental contents in solid, liquid or slurry-like materials; which measuring window (2) separates the sampling space (3) containing the sample material to be measured and the measurement space (4) containing the measuring probe (11), and is sealed by a lid structure (6) arranged in the sampling space, said lid structure defining the measurement aperture (7) of the sampling space, in which case the lid structure defining the measurement aperture of the sampling space is provided with a sealing surface (8) of the measuring window, so that said surface is at least partly planar and at least partly curved.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.