Reflector time-of-flight mass spectrometry with simultaneous space and velocity focusing
US8674292B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 24, 2011 |
| Grant date | Mar 18, 2014 |
| Priority date | — |
| Expiry date | Oct 18, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/403
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A time-of-flight mass spectrometer includes an ion source that generates ions. A two-field ion accelerator accelerates the ions through an ion flight path. A pulsed ion accelerator focuses the ions to a first focal plane where the ion flight time is substantially independent to first order of an initial velocity of the ions prior to acceleration. An ion reflector focuses ions to a second focal plane where the ion flight time is substantially independent to first order of an initial velocity of the ions prior to acceleration. An ion detector positioned at the second focal plane detects the ions. The two-field ion accelerator and the ion reflector cause the ion flight time to the ion detector for the ion of predetermined mass-to-charge ratio to be substantially independent to first order of both the initial position and the initial velocity of the ions prior to acceleration.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.