Patent · US Active

Multireflection time-of-flight mass spectrometer

US8674293B2 · kind B2 · utility

3Cited by
3References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 8, 2013
Grant dateMar 18, 2014
Priority date
Expiry dateMar 8, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J49/405
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A method of reflecting ions in a multireflection time of flight mass spectrometer is disclosed. The method includes guiding ions toward an ion mirror having multiple electrodes, and applying a voltage to the ion mirror electrodes to create an electric field that causes the mean trajectory of the ions to intersect a plane of symmetry of the ion mirror and to exit the ion mirror, wherein the ion are spatially focussed by the mirror to a first location and temporally focused to a second location different from the first location. Apparatus for carrying out the method is also disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.