Systems and methods for digital calibration of successive-approximation-register analog-to-digital converter
US8674862B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 5, 2012 |
| Grant date | Mar 18, 2014 |
| Priority date | — |
| Expiry date | Sep 5, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/804
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
Systems and methods of calibrating a successive approximation register analog-to-digital converter (ADC) are disclosed. A plurality of capacitor stages, a first capacitor array, and a first capacitor stage are coupled in parallel. A capacitance of the first capacitor stage is compared to a sum of capacitances of the plurality of capacitor stages and of the first capacitor array. In response to the comparing, the capacitance of the first capacitor stage is increased by increasing the capacitance of a second capacitor array if the capacitance of the first capacitor stage is less than the sum of the capacitances of the plurality of capacitor stages and of the first capacitor array.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.