Hot gas path measurement
US8678644B2 · kind B2 · utility
0Cited by
14References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 16, 2011 |
| Grant date | Mar 25, 2014 |
| Priority date | — |
| Expiry date | Jan 17, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K13/024
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A hot gas path measurement apparatus is provided and includes a substrate having a coating applied on a surface thereof such that the coating is interposed between the substrate and a hot gas path; and a measurement device fixed in a recess formed in the substrate, the measurement device including a sensor, and a holder configured to position the sensor in an alignment condition with a plane of a surface of the coating or at least partially within a span of the hot gas path.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.