Method and device for characterizing wafers during the production of solar cells

US8679361B2 · kind B2 · utility

Assignee

• Q-CELLS SE · DE

Inventors

• Jörg Müller · Chemnitz, DE
• Jörg Isenberg · Leipzig, DE
• Jörn Suthues · Leipzig, DE
• Martin Bivour · Berlin, DE
• Jean Patrice Rakotoniaina · Halle (Saale), DE

Key dates

• Filing date: Oct 11, 2007
• Grant date: Mar 25, 2014
• Expiry date: Jan 4, 2031

Classification

• Technology area (CPC Y): Emerging Cross-Sectional Technologies
• CPC primary: Y02P70/50
• WIPO field: Semiconductors
• WIPO sector: Electrical engineering

Abstract

The invention relates to a method and device for characterizing wafers during the production of solar cells. Characterizing wafers includes a) providing a wafer and carrying out a production process with the wafer for producing a solar cell or a plurality of solar cells; b) carrying out a wet chemical step with the wafer during the production process, wherein the wet chemical step decreases an influence of the wafer surface on a lifetime of charge carriers in the wafer; c) irradiating the wafer with light for creating the charge carriers in the wafer during the wet chemical step or after the wet chemical step; d) determining the lifetime of the charge carriers created in step c); and e) characterizing the wafer by means of the lifetime determined in step d).