Patent · US Active

Device for measuring material thickness

US8680745B2 · kind B2 · utility

2Cited by

34References

18Claims

0Family size

Assignee

General Electric Company · US

Inventors

Fred Timothy Matthews · Lewistown, US
Paul Aloysius Meyer · McVeytown, US
Matthew Harvey Krohn · Lewistown, US
Nathan John Smith · Lewistown, US
Adeodato Maria Vigano · Monroeville, US

Key dates

Filing date	Dec 27, 2011
Grant date	Mar 25, 2014
Priority date	—
Expiry date	Aug 26, 2032

Classification

Technology area (CPC G)Physics
CPC primaryG01N2291/2634
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A piezoelectric sensing device is described for measuring material thickness of targets such as pipes, tubes, and other conduits that carry fluids. The piezoelectric sensing device includes a piezoelectric element mounted to a flexible circuit with glass reinforced polyimide C-stage cover layers surrounding a pure polyimide C-stage core.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.