System and method for security inspection using microwave imaging
US8681035B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 8, 2005 |
| Grant date | Mar 25, 2014 |
| Priority date | — |
| Expiry date | Mar 23, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01Q21/065
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A microwave imaging system uses microwave radiation provided by a microwave source to image targets. The system includes an array of antenna elements that are capable of being programmed with a respective direction coefficient to direct the microwave illumination from the microwave source toward a position on the target. The antenna elements are further capable of being programmed to receive reflected microwave illumination reflected from the position on the target. A processor is operable to measure an intensity of the reflected microwave illumination to determine a value of a pixel within an image of the target. Multiple beams can be directed towards the target to obtain corresponding pixel values for use by the processor in constructing the image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.