Patent · US Active

Multiple ion injection in mass spectrometry

US8686350B2 · kind B2 · utility

3Cited by
12References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 29, 2013
Grant dateApr 1, 2014
Priority date
Expiry dateMar 29, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J49/4265
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

This invention relates to mass spectrometry that includes ion trapping in at least one of the stages of mass analysis. In particular, although not exclusively, this invention relates to tandem mass spectrometry where precursor ions and fragment ions are analyzed. A method of mass spectrometry is provided comprising the sequential steps of: accumulating in an ion store a sample of one type of ions to be analyzed; accumulating in the ion store a sample of another type of ions to be analyzed; and mass analyzing the combined samples of the ions; wherein the method comprises accumulating the sample of the one type of ions and/or the sample of another type of ions to achieve a target number of ions based on the results of a previous measurement of the respective type of ions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.