Sub-microsecond-resolution probe microscopy

US8686358B2 · kind B2 · utility

Assignee

• University of Washington through its Center for Commercialization · US

Inventors

• David Ginger · Evanston, US
• Rajiv Giridharagopal · Portland, US
• David Moore · Seattle, US
• Glennis Rayermann · Seattle, US
• Obadiah G. Reid · Fort Collins, US

Key dates

• Filing date: Sep 14, 2011
• Grant date: Apr 1, 2014
• Expiry date: May 25, 2032

Classification

• Technology area (CPC G): Physics
• CPC primary: G01Q60/32
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.