Method and apparatus for preparing serial planar cross sections
US8686379B1 · kind B1 · utility
3Cited by
16References
26Claims
0Family size
Inventor
Key dates
| Filing date | Sep 7, 2011 |
| Grant date | Apr 1, 2014 |
| Priority date | — |
| Expiry date | May 21, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/31745
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
Systems for preparing solid samples for microscopic examination in cross section or planametric orientation. The sample preparation systems include a sample support, an excitation beam to remove material from the surface of the sample, and a beam shield that protects the sample from the excitation beam, where sequential vertical adjustment of the beam shield permits the selective exposure of a series of substantially planar sample surfaces.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.