Patent · US Active

Test apparatus and method for measuring common-mode capacitance

US8686746B2 · kind B2 · utility

6Cited by

2References

20Claims

0Family size

Assignee

Delta Electronics, Inc. · TW

Inventors

Min Zhou · Suzhou, CN
Yicong Xie · Huangpu District, CN
Jinping Zhou · 红钢城街道, CN
Jianping Ying · Shanghai, CN

Key dates

Filing date	Jun 30, 2010
Grant date	Apr 1, 2014
Priority date	—
Expiry date	Apr 23, 2032

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/001
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Disclosed is a test apparatus for measuring the common-mode parasitic capacitance between a first element and a second element being isolated from the first element. The test apparatus includes a signal generating device connected to the first element and having an internal signal source connected in series with a first internal impedance for sending a signal to the first element, and a signal receiving device connected between the second element and the first element and having a second internal impedance for measuring a signal response between the first element and the second element, thereby calculating the common-mode capacitance between the first element and the second element based on the signal response.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.