System, method, and device for determining a focal position of an objective in a microscopy imaging system
US8687180B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 7, 2012 |
| Grant date | Apr 1, 2014 |
| Priority date | — |
| Expiry date | Jun 7, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG16B99/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method of determining a focal position for an objective positioned at a measurement location of a sample holder in a microscopy imaging system are provided. The objective is moved to a position relative to the sample holder that corresponds to a distance between the objective and the sample holder. The sample holder has a conditioned upper surface. A focusing light beam is projected onto the sample holder when the objective is located at the position, and the objective focuses the focusing light beam on the sample holder. A reflected light beam resulting from reflection of the focusing light beam off the conditioned upper surface is observed. The focal position for the objective is determined based on the reflected light beam such that the objective produces an in focus image of a microscopy sample when the objective is located at the focal position.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.