Robust patch regression based on in-place self-similarity for image upscaling
US8687923B2 · kind B2 · utility
10Cited by
5References
20Claims
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Key dates
| Filing date | Aug 2, 2012 |
| Grant date | Apr 1, 2014 |
| Priority date | — |
| Expiry date | Aug 2, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods and systems for image upscaling are disclosed. In one embodiment, a low frequency band image intermediate is obtained from an input image. The input image is upsampled by a scale factor to obtain an upsampled image intermediate. A result image is estimated based at least in part on the upsampled image intermediate, the low frequency band image intermediate, and the input image, wherein the input image is of a smaller scale than the result image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.