Predictive run testing
US8689187B2 · kind B2 · utility
2Cited by
5References
29Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 7, 2007 |
| Grant date | Apr 1, 2014 |
| Priority date | — |
| Expiry date | Aug 28, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3676
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A test object can be selectively included in a test run based on predicting the behavior of the test object. In one embodiment, the present invention includes predicting how likely the test object is to produce a failure in a test run and deciding whether to include the test object in the test run based on the predicted likelihood. This likelihood of producing a failure may be based on any number of circumstances. For example, these circumstances may include the history of prior failures and/or the length of time since the test object was last included in a test run.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.