Patent · US Active

System and method for analyzing alternatives in test plans

US8689188B2 · kind B2 · utility

19Cited by

29References

27Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

Kathryn A. Bassin · Harpursville, US
Howard M. Hess · Winnetka, US
Steven Kagan · Burr Ridge, US
Shao Chun Li · Beijing, CN
Zhong J. Li · Shanghai, CN
He H. Liu · Beijing, CN
Susan E. Skrabanek · Talking Rock, US
Hua F. Tan · Beijing, CN
Jun Zhu · Shanghai, CN

Key dates

Filing date	Sep 11, 2009
Grant date	Apr 1, 2014
Priority date	—
Expiry date	Mar 31, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/3672
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method includes creating an initial test plan including initial estimates of effort and defect distributions, creating an alternative test plan including alternative estimates of effort and defect distributions, and displaying at least one metric of the initial test plan and the alternative test plan side by side for comparison by a user.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.