Patent · US Active

Deposition of active films

US8689734B2 · kind B2 · utility

0Cited by
2References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 16, 2008
Grant dateApr 8, 2014
Priority date
Expiry dateOct 24, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/32091
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A plasma reactor (1) for treating a substrate (40), comprises at least two electrodes (20, 30) arranged within the reactor (1) defining an internal process space (13) there between, whereas the two electrodes (20, 30) are located opposed to each other and parallel with respect to a first surface (20a) of the electrodes (20, 30). Further it comprises a gas inlet (11) and a gas outlet (12) for transporting gas in and out of the plasma reactor (1), a radiofrequency generator (21) connected to at least one of the electrodes (20, 30). At least one of the electrodes (20, 30) has a corrective layer having a non planar shape along a surface (20a) facing the internal process space (13) which has in a first cross section along a radius of the electrode (20) a profile comprising three consecutive and adjacent segments, namely a first, a second and a third segment, where the third segment is adjacent to an edge of the electrode (20) and whereas medium gradient in the first segment is less than a medium gradient in the second segment and a medium gradient in the second segment is larger than a medium gradient in the third segment. An electrode (20) shaped in the above described manner provides …

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.