Measurement method and device for measuring layer thicknesses as well as production method and coating system
US8691322B2 · kind B2 · utility
2Cited by
1References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 10, 2012 |
| Grant date | Apr 8, 2014 |
| Priority date | — |
| Expiry date | May 10, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B21/085
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for measuring the thickness of a coating on a component section of a rotating component, wherein a heat expansion of the component section is determined by detecting a component core temperature and an actual coating thickness is produced, a device for conducting a method of this type having a temperature detecting system and having an evaluating device, as well as a production process and a coating system, are disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.