Patent · US Active

Measurement method and device for measuring layer thicknesses as well as production method and coating system

US8691322B2 · kind B2 · utility

2Cited by
1References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 10, 2012
Grant dateApr 8, 2014
Priority date
Expiry dateMay 10, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B21/085
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for measuring the thickness of a coating on a component section of a rotating component, wherein a heat expansion of the component section is determined by detecting a component core temperature and an actual coating thickness is produced, a device for conducting a method of this type having a temperature detecting system and having an evaluating device, as well as a production process and a coating system, are disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.