Device for analysis of a sample on a test element
US8692119B2 · kind B2 · utility
1Cited by
15References
13Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 6, 2012 |
| Grant date | Apr 8, 2014 |
| Priority date | — |
| Expiry date | Nov 6, 2032 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B5/14532
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An analysis device for analysis of a sample on a test element is provided that comprises at least one component configured to make electrical contact with at least one other component for electrical transmission therebetween. The at least one component generally comprises an injection-molded circuit mount, also called an MID, or molded interconnect device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.