Thermal imaging method and apparatus for evaluating coatings
US8692887B2 · kind B2 · utility
20Cited by
27References
14Claims
0Family size
Assignee
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Key dates
| Filing date | Aug 27, 2010 |
| Grant date | Apr 8, 2014 |
| Priority date | — |
| Expiry date | Nov 22, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J5/48
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus is provided for determining variable thickness of a coating on a surface of a substrate using in part a flash-lamp source, capable of generating a thermal pulse at the coating surface, and a image capture and processing device capable of capture sequential image frames of the coating surface, whereas each sequential image frame corresponds to an elapsed time and comprises a pixel array, and wherein each pixel of the array corresponds to a location on the coating surface. A method of calculating coating thickness is also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.