Dynamic shaping time modification in X-ray detectors
US8693625B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 4, 2009 |
| Grant date | Apr 8, 2014 |
| Priority date | — |
| Expiry date | Jun 24, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/076
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and apparatus for adapting the shaping time and/or other pulse processing parameters of an x-ray detector (114) in accordance with the elemental composition of a sample and/or energy resolving requirements. X-rays (104) are directed from a source (102) onto a sample (110) and the radiation (108) responsively emitted from the sample (e.g., fluoresced radiation characteristic of the sample's elemental composition) and detected by an x-ray detector (114) that generates pulses representative of the energy and intensity of the incident radiation. Based upon initial analysis of elemental composition, the shaping time and/or other pulse processing parameter (s) are set to optimize count rate subject to constraints of energy resolution in a spectral region of interest.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.