Solid material characterization with X-ray spectra in both transmission and fluoresence modes
US8693626B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 17, 2011 |
| Grant date | Apr 8, 2014 |
| Priority date | — |
| Expiry date | Dec 16, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/645
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods are disclosed utilizing synchrotron X-ray microscopy including x-ray fluorescence and x-ray absorption spectra to probe elemental distribution and elemental speciation within a material, and particularly a solid that may have one or more elements distributed on a solid substrate. Representative materials are relatively homogeneous in composition on the macroscale but relatively heterogeneous on the microscale. The analysis of such materials, particularly on a macroscale at which their heterogeneous nature can be observed, provides valuable insights into the relationships or correlations between localized concentrations of elements and/or their species, and concentrations of other components of the materials. Sample preparation methods, involving the use of a reinforcing agent, which are advantageously used in such methods are also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.