One-dimension position encoder
US8698892B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 3, 2009 |
| Grant date | Apr 15, 2014 |
| Priority date | — |
| Expiry date | May 28, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/202
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A one-dimension position measurement system includes: a first ruler having a first one-dimension binary code si applied thereon, a camera for acquiring a picture of a portion of the code si, the portion having a length of I bits, and some processing elements. Each codeword of length I of the one-dimension code si is unique within the whole code si. A codeword ai is read from the acquired picture, and the processing elements are implemented for computing an absolute position p of the codeword ai of the code si from: (I). An ad-hoc interpolation method is used to obtain a precision way below the distance between two bits of the codewords. The code si may be applied on the ruler by using some geometric primitives, a geometric primitive for encoding a “1” being different from a geometric primitive for encoding a “0”, both having the same horizontal projection. The horizontal projection is then used for fine interpolation, achieving nanometer-scale resolution.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.