Patent · US Active

One-dimension position encoder

US8698892B2 · kind B2 · utility

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4References
24Claims
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Key dates

Filing dateApr 3, 2009
Grant dateApr 15, 2014
Priority date
Expiry dateMay 28, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03M1/202
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A one-dimension position measurement system includes: a first ruler having a first one-dimension binary code si applied thereon, a camera for acquiring a picture of a portion of the code si, the portion having a length of I bits, and some processing elements. Each codeword of length I of the one-dimension code si is unique within the whole code si. A codeword ai is read from the acquired picture, and the processing elements are implemented for computing an absolute position p of the codeword ai of the code si from: (I). An ad-hoc interpolation method is used to obtain a precision way below the distance between two bits of the codewords. The code si may be applied on the ruler by using some geometric primitives, a geometric primitive for encoding a “1” being different from a geometric primitive for encoding a “0”, both having the same horizontal projection. The horizontal projection is then used for fine interpolation, achieving nanometer-scale resolution.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.